Electronic Engineering Department, The Chinese University of Hong Kong - Outlook and Challenges of Electrostatic Discharge (ESD) Protection of Modern and Future Integrated Circuits

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Outlook and Challenges of Electrostatic Discharge (ESD) Protection of Modern and Future Integrated Circuits

Date Jan 12, 2018 (Fri)
Time 10:00 AM
Venue Room 222, Ho Sin Hang Engineering Building, CUHK
Speakers Dr. LIOU, Juin J.
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