Electronic Engineering Department, The Chinese University of Hong Kong - Real-time Observation of Ion Migration in Inorganic–Organic Metal Halide Perovskite and Its Influence on Device Stability

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Real-time Observation of Ion Migration in Inorganic–Organic Metal Halide Perovskite and Its Influence on Device Stability

Date Jan 16, 2019 (Wed)
Time 04:00 PM
Venue Room 222, Ho Sin Hang Engineering Building, CUHK
Speakers Dr. CHENG, Li
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